Multilayer ceramic capacitors (MLCCs) are key building blocks in modern electronics. MLCCs comprise ~30% of the total components in a typical hybrid circuit module such as a DC-DC converter. The numbers of ceramic capacitors used in integrated circuit (IC) power supply decoupling applications are even greater.
Quality assessment and lifetime prediction of base metal electrode ...
Oct 1, 2023 · This approach provides useful insights into mobile defects and resistance of MLCC to oxygen vacancy electromigration, facilitating in determining the existence of potential flaws. Furthermore, existing models for predicting the lifetime of MLCCs have limitations.
Insulation resistance (IR) degradation related to oxygen vacancy migration has been considered to be the primary cause of reliability degradation of multilayer ceramic capacitors (MLCCs) with base-metal electrodes (BMEs). The behavior is characterized by a slow increase in the leakage. current under an applied direct-current (DC) field stress.
In this work, water layer testing was developed to mimic processes in cracks and was used for in-situ, high-power, optical observations of electrochemical migration and dendrite growth in BME and PME capacitors.
The evaluation of multilayer ceramic capacitors (MLCCs) with Ni electrode and BaTiO3 dielectric material for potential space project applications requires an in-depth understanding of their reliability. A general reliability model for Ni-BaTiO3 MLCC is developed and discussed.
Time-dependent degradation in insulation resistance (IR) related to oxygen vacancy migration has been considered to be the primary cause of reliability degradation of multilayer ceramic capacitors (MLCCs) with base-metal electrodes (BME).
Lifetime Prediction of BME MLCC Capacitors
Oct 6, 2023 · This approach provides useful insights into mobile defects and resistance of MLCC to oxygen vacancy electromigration, facilitating in determining the existence of potential flaws. Furthermore, existing models for predicting the lifetime of MLCCs have limitations.
To improve the reliability and slow transient mechanisms of oxygen vacancy electromigration that drive the degradation of insulation resistance of MLCCs, we need to develop new models and improved metrologies to enhance the performance of MLCCs.
resistance (IR) degradation related to oxygen vacancy migration has been considered to be the primary cause of reliability degradation of multilayer ceramic capacitors (MLCCs) with base-metal electrodes (BMEs). The behavior is characterized by a slow increase in the leakage current under an applied direct current (dc) field stress.
Determining the effect of burn-in process on reliability of X7R ...
Aug 22, 2022 · The electromigration of oxygen vacancies during burn-in tests shorten the lifetime of MLCC population by reducing the protection effects of double Schottky barriers at the grain boundaries and electrode interfaces.